PRODUCT
MANUAL TYPE
TM4-2020
TM4-2020
High-Resolution Thin Film Measurement System
High Resolution Measurement for Advanced Thin Films
TM4-2020은 미세 영역의 박막을 정밀하게 측정할 수 있도록 설계된 수동형 Thin Film Measurement System입니다
Specification
| Wavelength | : 400 – 800 nm |
| Measurement Range | : 100 Å – 100 μm* |
| Spot Size | : 40 / 20 μm |
| Stage Size | : Up to 300 × 300 mm |
| Motion | : Manual |
| Option | : NIR Detector |
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